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A TEM Study of Oxidised Si3N4 Material

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Periodical:

Key Engineering Materials (Volume 113)

Pages:

71-80

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.113.71

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Online since:

July 1995

Authors:

Colette O'Meara, J. Sjöberg

Keywords:

Microstructure, Oxidation, Oxide Scale, TEM

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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