In Situ Observation of Oxide Films Formed during Thermal Oxidation of SiC-B4C Composite Using Raman Spectroscopy

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Periodical:

Edited by:

R.J. Fordham, D.J. Baxter and T. Graziani

Pages:

99-104

DOI:

10.4028/www.scientific.net/KEM.113.99

Citation:

T. Narushima et al., "In Situ Observation of Oxide Films Formed during Thermal Oxidation of SiC-B4C Composite Using Raman Spectroscopy", Key Engineering Materials, Vol. 113, pp. 99-104, 1996

Online since:

July 1995

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$35.00

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