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HomeKey Engineering MaterialsKey Engineering Materials Vol. 113In Situ Observation of Oxide Films Formed during...

In Situ Observation of Oxide Films Formed during Thermal Oxidation of SiC-B₄C Composite Using Raman Spectroscopy

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Corrosion of Advanced Ceramics

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Periodical:

Key Engineering Materials (Volume 113)

Pages:

99-104

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.113.99

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Online since:

July 1995

Authors:

Takayuki Narushima, Miho Maruyama, H. Arashi, Takashi Goto, Toshio Hirai, Yasutaka Iguchi

Keywords:

Boron Carbide, In Situ Observation, Oxidation, Raman Spectroscopy, Silicon Carbide (SiC)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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