Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method

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Periodical:

Key Engineering Materials (Volumes 161-163)

Edited by:

K. Niihara, T. Sekino, E. Yasuda, T. Sasa

Pages:

31-34

DOI:

10.4028/www.scientific.net/KEM.161-163.31

Citation:

Y. Yasutomi et al., "Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method", Key Engineering Materials, Vols. 161-163, pp. 31-34, 1999

Online since:

July 1998

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$35.00

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