Creep at the Mesoscopic and Microscopic Scale of 2.5D Cf-SiC

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Periodical:

Key Engineering Materials (Volumes 164-165)

Edited by:

K. Niihara, K. Nakano, T. Sekino, E. Yasuda

Pages:

313-316

DOI:

10.4028/www.scientific.net/KEM.164-165.313

Citation:

G. Boitier et al., "Creep at the Mesoscopic and Microscopic Scale of 2.5D Cf-SiC", Key Engineering Materials, Vols. 164-165, pp. 313-316, 1999

Online since:

July 1998

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$35.00

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