Direct Surface Force Measurement of Particles from Micron to Nanosize

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Edited by:

Katsutoshi Komeya, Mamoru Mitomo, Yi-Bing Cheng

Pages:

185-192

DOI:

10.4028/www.scientific.net/KEM.237.185

Citation:

J. M. Cho et al., "Direct Surface Force Measurement of Particles from Micron to Nanosize", Key Engineering Materials, Vol. 237, pp. 185-192, 2003

Online since:

April 2003

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$35.00

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