Direct Surface Force Measurement of Particles from Micron to Nanosize


Article Preview



Main Theme:

Edited by:

Katsutoshi Komeya, Mamoru Mitomo, Yi-Bing Cheng




J. M. Cho et al., "Direct Surface Force Measurement of Particles from Micron to Nanosize", Key Engineering Materials, Vol. 237, pp. 185-192, 2003

Online since:

April 2003




[1] Hunter R J (1987) Foundation of Colloid Science (Vol. 1). Chap. 7. (Claredon: Oxford).

[2] Greathouse J A and McQuarrie D A (1996) Conventional hypernetted chain force calculations for charged plates with adsorbing counterions. J. Colloid Interface Sci. 181, pp.319-25.


[3] Napper D H (1986) Polymer Stabilization of Colloidal Dispersions. (Academic, New York).

[4] Sigmund W, Bell N, and Bergström L (2000) Novel Powder processing Methods for Advanced Ceramics J. Am. Ceram. Soc. 83(7), pp.1557-74.

[5] Israelachvili J N and Adams G E (1976) Direct measurement of long-range forces between 2 mica surfaces in aqueous KNO3 solutions Nature 262, pp.773-76.


[6] Dai H, Hafner J H, Rinzler A G, Colbert D T, and Smalley R E (1996) Nature384, pp.147-50.

[7] Cheung C L, Hafner J H, Odom T W, Kim K, and Lieber C M (2000) Appl. Phys. Lett. 76, pp.3136-38.

[8] Moloni K, Buss M R, and Andres R P (1999) Tapping mode scanning force microscopy in water using a carbon nanotube probe Ultramicroscopy 80, pp.237-46.


[9] Jarvis S P, Uchihashi T, Ishida T, and Tokumoto H (2000) Local solvation shell measurement in water using a carbon nanotube probe J. Phys. Chem. B 104, pp.6091-94. 8.


[10] Garg A and Sinnot S B (1999) Molecular dynamics of carbon nanotube proximal probe tipsurface contacts Phys. Rev. B 60, pp.3786-91.

[11] Wong E W, Sheehan P E, and Lieber C M (1997) Nanobeam mechanics: elasticity, strength, and toughness of nanorods and nanotubes Science 277, pp.1971-75.


[12] Lee S and Sigmund W (2001) Repulsive van der Waals Forces for Silica and Alumina J. Colloid Interface Science243, pp.365-369.


[13] Lee S and Sigmund W M (2001) AFM Study of Repulsive van der Waals Forces between Teflon AFTM Thin Film and Silica or Alumina Colloids and Surfaces A, in press.