A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces

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Periodical:

Key Engineering Materials (Volumes 257-258)

Edited by:

Thomas Pearce, Yongsheng Gao, Jun'ichi Tamaki and Tsunemoto Kuriyagawa

Pages:

225-230

DOI:

10.4028/www.scientific.net/KEM.257-258.225

Citation:

H. Yang et al., "A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces", Key Engineering Materials, Vols. 257-258, pp. 225-230, 2004

Online since:

February 2004

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Price:

$35.00

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