Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

1143-1146

DOI:

10.4028/www.scientific.net/KEM.270-273.1143

Citation:

G. W. Park et al., "Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film", Key Engineering Materials, Vols. 270-273, pp. 1143-1146, 2004

Online since:

August 2004

Export:

Price:

$38.00

[1] Y. J. Hur, S. H. Jin, Y. S. Gal, J. H. Kim, S. H. Kim and K. Koh: Mol. Cryst. Liq. Cryst. Vol. 377 (2002), p.217.

[2] K. Kazuyoshi and S. Koji: Anal. Chem. Vol. 74 (2002), p.696.

[3] J. Homola, S. S. Yee and G. Gauflitz: Sensors and Actuator B Vol. 54 (1999), p.3.

[4] A. G. Frutos, S. C. Weibel and R. M. Corn: Anal. Chem. Vol. 71 (1999), p.3935.

[5] R. J. Green, R. A. Frazier, K. M. Shakesheff, M. C. Davies, C. J. Roberts and S. J. B. Tendler: Biomaterials. Vol. 21 (2000), p.1823.

[6] O. S. Heavens: Optical Properties of Thin Solid Films (Dover Publications Inc. New York 1965).

[7] H. Muguruma, A. Hiratsuka and I. Karube: Anal. Chem. Vol. 72 (2000), p.2671.

[8] C. J. Mathai, S. Saravanan, M. R. Anantharman, S. Venkitachalam and Jayalekshimi: J. Phys. D Vol. 35 (2002), p.240.

[9] I. Pockrand, J. D. Swalen, J. G. Gordon and M. R. Philpott: Surface Sci. Vol. 74 (1978), p.237.

[10] K. A. Peterlinz and R. Georgiadis: Opt. Commun. Vol. 130 (1996), p.260.

[11] F. Mirkhalaf and D. J. Schiffrin: J. Electroanal. Chem. Vol. 484 (2000), p.182.

[12] G. Tzamalis, N. A. Zaidi, C. C. Homes and A. P. Monkman: Phys. Rev. B Vol. 66 (2002), p.085202.

[13] V. Luthara, R. Singh and A. Mansingh: Synthetic Metals Vol. 119 (2001), p.291.

[14] S. H. Jin, J. E. Jin, S. B. Moon, H. J. Lee, Y. S. Gal, H. D. Kim, S. H. Kim, S. H. Kim and K. Koh: J Polym. Sci. B: Polym. Chem. Vol. 40 (2002), p.958.

DOI: 10.1002/pola.10188

[15] H. P. Chiang, Y. C. Wang and P. T. Leung: Thin Solid Films Vol. 425 (2003), p.135.

[16] K. Kato, C. M. Dooling, K. Shinbo, T. H. Richardson, F. Kaneko, R. Tregonning, M. O. Vysotsky and C. A. Hunter: Colloids and Surfaces A Vol. 198 (2002), p.811.

DOI: 10.1016/s0927-7757(01)01006-8

[17] A. K. Hassan, A. V. Nabok, A. K. Ray, A. Lucke, K. Smith, C. J. M. Stirling and F. Davis: Mat. Sci. Eng. C Vol. 8 (1999), p.251.

[18] S. Lakovlev, C. H. Solterbeck and M. Es-souni: Appl. Phys. Lett. Vol. 81 (2002), p.1854.

[19] R. Singh, V. Arora, R. P. Tandon, A. Manisingh and S. Chandra: Synthetic Metals Vol. 104 (1999), p.134.

[20] B. Xu, Y. Ye, Q. M. Wang and L. E. Cross: J. Appl. Phys. Vol. 85 (1999), p.3753.

[21] R. Singh, V. Arora, R. P. Tandon and S. Chandra: J. Mat. Sci. Vol. 33 (1998), p. (2067).

In order to see related information, you need to Login.