Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film


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Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee




G. W. Park et al., "Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film", Key Engineering Materials, Vols. 270-273, pp. 1143-1146, 2004

Online since:

August 2004




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