Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

359-363

DOI:

10.4028/www.scientific.net/KEM.270-273.359

Citation:

C. H. Ho et al., "Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection", Key Engineering Materials, Vols. 270-273, pp. 359-363, 2004

Online since:

August 2004

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Price:

$35.00

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