The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

625-629

DOI:

10.4028/www.scientific.net/KEM.270-273.625

Citation:

H. Kim and T. Shoji, "The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique ", Key Engineering Materials, Vols. 270-273, pp. 625-629, 2004

Online since:

August 2004

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$35.00

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