The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

625-629

Citation:

H. Kim and T. Shoji, "The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique ", Key Engineering Materials, Vols. 270-273, pp. 625-629, 2004

Online since:

August 2004

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[1] H. Kim and E. G. Na, A study on the non-contact detection technique of defects using Ac current - The influence of frequency and lift-off -,. Journal of the korean society for nondestructive testing, Vol. 22, No. 1, 2002, pp.53-58.

[2] M. Saka, D. yuasa, H. Abe and K. Sugino, Nondestructive characterization of Bifurcated crack by potental drop technique, NDT&E, Vol. 7, 1992, pp.61-72.

DOI: https://doi.org/10.1080/10589759208952988

[3] Kim, H. and Shoji, T., Study on the evaluation of inclined crack by ICFPD technique,. Journal of JSNDI, Vol. 44, No, 9, 1995, pp.730-735.