Ultrasonic Characterization of Thin Film Material Constants and Defects


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Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee




J. D. Achenbach "Ultrasonic Characterization of Thin Film Material Constants and Defects", Key Engineering Materials, Vols. 270-273, pp. 8-13, 2004

Online since:

August 2004





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