Carbon Nanotube as Probe for Atomic Force Microscope

Abstract:

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An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication’s difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.

Info:

Periodical:

Key Engineering Materials (Volumes 315-316)

Edited by:

Zhejun Yuan, Xipeng Xu, Dunwen Zuo, Julong Yuan and Yingxue Yao

Pages:

758-761

DOI:

10.4028/www.scientific.net/KEM.315-316.758

Citation:

Z. W. Xu et al., "Carbon Nanotube as Probe for Atomic Force Microscope", Key Engineering Materials, Vols. 315-316, pp. 758-761, 2006

Online since:

July 2006

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Price:

$35.00

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