Determination of the Mechanism Based Deposition Processes of Thin Film in OLED


Article Preview

Physical vapor deposition technique has been employed to develop a thin film of OLED, and atomic force microscopy was used to investigate the boundary characteristics such as uniformity of emitting layer, roughness, and surface morphology. In order to determine the deposition characteristic which associated with the materials failure in OLED, finite element simulation, together with alternative analytical modeling has been carried out by means of island growth mechanism analysis. The boundary growth of thin film can be determined from the velocity of island boundary using simple rate equations. The results obtained are compared with experimental observation. Generally good agreement has been achieved.



Key Engineering Materials (Volumes 321-323)

Edited by:

Seung-Seok Lee, Joon Hyun Lee, Ik Keun Park, Sung-Jin Song, Man Yong Choi






K. K. Lee et al., "Determination of the Mechanism Based Deposition Processes of Thin Film in OLED", Key Engineering Materials, Vols. 321-323, pp. 1431-1434, 2006

Online since:

October 2006




[1] H. Aziz, Z.D. Popovic, N.X. Hu, A.M. Hor and G. Xu: Science Vol. 283 (1999), p. (1900).

[2] C.W. Tang and S.A. VanSlyke: Appl. Phys. Lett. Vol. 51 (1987), p.913.

[3] M. Ishii and Y. Taga: Appl. Phys. Lett. Vol. 80 No. 18 (2002), p.3430.

[4] M.F. Gyure, C. Ratsch, B. Merriman, R.E. Caflisch, S. Osher, J.J. Zinck and D.D. Vvedensky: Phys. Rev. E Vol. 58 No. 6 (1998), p. R6927.

DOI: 10.1103/physreve.58.r6927

[5] R.M. Logan: Thin solid films Vol. 3 No. 1 (1969), p.59.

[6] M.J. Stowell and T.E. Hutchinson: Thin solid films Vol. 8 No. 1 (1971), p.41.

[7] C. Ratsch, M.F. Gyure, F. Gibou, M. Petersen, M. Kang and D.D. Vvedensky: Phys. Rev. B Vol. 65 (2002), p.195.

[8] J.A. Venables: Phys. Rev. B Vol. 36 No. 8 (1986), p.4153.

[9] J.A. Venables: J. Vac. Technol. B Vol. 4 No. 4 (1986), p.870.

[10] H. Brune, G.S. Bales, J. Jacobsen, C. Boragno and K. Kern: Phys. Rev. B Vol. 60 No. 8 (1999), pp.5991-100 � 100 � 100 �.

In order to see related information, you need to Login.