Uncertainty Improvements of Metallic Resistivity Measurements by the Four-Point Probe Method

Abstract:

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Besides well-known destructive methods for material degradation, the electrical resistivity method has been used as one of nondestructive evaluation methods because of easy measurement. To use the method, however, careful geometrical corrections and thickness measurements are required. The high current probe assembly and accurate thickness measurement device were developed to improve overall measurement uncertainty. If dual configuration Four-Point Probe method with the developed devices is used, overall measurement uncertainty of electrical resistivity could be reduced to 0.44 % at 95 % confidence level. Proper selection of the probe spacing matched with sample thickness is very important to determine accurate electrical resistivity. When sample thickness is less than probe spacing, it is expected that dual configuration Four-Point Probe technique can be used in nondestructive evaluation of plant equipment materials.

Info:

Periodical:

Key Engineering Materials (Volumes 321-323)

Edited by:

Seung-Seok Lee, Joon Hyun Lee, Ik Keun Park, Sung-Jin Song, Man Yong Choi

Pages:

1470-1474

DOI:

10.4028/www.scientific.net/KEM.321-323.1470

Citation:

K. M. Yu et al., "Uncertainty Improvements of Metallic Resistivity Measurements by the Four-Point Probe Method", Key Engineering Materials, Vols. 321-323, pp. 1470-1474, 2006

Online since:

October 2006

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Price:

$35.00

[1] S.H. Nahm, Y.I. Kim, K.M. Yu and A. Kim, Fourth Far East Conference on NDT(FENDT'97), Cheju-do, Korea, October 8-11(1997), pp.397-406.

[2] Seung Hoon Nahm, Kwang Min Yu, Jong Seo Park and Young Hyun Nam, Sang In Han, Jeong Min Kim, Am Kee Kim, International Journal of Modern Physics B Vol. 17, Nos. 8&9(2003), pp.1615-1620.

DOI: 10.1142/s021797920301940x

[3] Seung-Hoon Nahm, Jeong-Min Kim, Jong-Seo Park, Kwang-Min Yu, Dong-Kyun Kim, Amkee Kim and Dong-Jin Kim, Key Engineering Materials Vols. 270-273(2004), pp.1212-1217.

DOI: 10.4028/www.scientific.net/kem.270-273.1212

[4] Van der Pauw, Philips Res. Rep, vol. 13(1958), pp.1-9.

[5] ASTM F 1529-97, Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure, (1997).

DOI: 10.1520/f1529

[6] F.M. Smits, The Bell system technical journal(1958) pp.711-718.

[7] C. Kasl and M.J.R. Hoch, Review of Scientific Instruments, Vol. 76(2005), 033907-1-033907-4.

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