Application of Ultrasonic Test on Creep-Fatigue Life Evaluation


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This work investigates the relationship between the creep-fatigue life and ultrasonic test of creep-fatigue damage. Under the creep-fatigue interaction, the main cause of life reduction is the initiation and growth of microvoid with increasing hold time. The number/size of microvoid/cavity, the fraction of cavity area varied with the hold time. Therefore, the life evaluation using the microvoid with the variation of hold time is very informative for safety of components in power plants. In this study, using the heat resisting alloy, P122 steel for USC (ultra super critical) power plant, the creep-fatigue tests with various hold times and their ultrasonic inspection were carried out for the purpose of evaluation for creep-fatigue life. The results obtained by Rayleigh surface wave of backscattered ultrasound were compared and analyzed with the experimental parameters. The good agreement between the experimental life and the predicted life was obtained.



Key Engineering Materials (Volumes 321-323)

Edited by:

Seung-Seok Lee, Joon Hyun Lee, Ik Keun Park, Sung-Jin Song, Man Yong Choi




B. J. Kim et al., "Application of Ultrasonic Test on Creep-Fatigue Life Evaluation", Key Engineering Materials, Vols. 321-323, pp. 476-479, 2006

Online since:

October 2006




[1] S. B. Lee, Y. J. Kim, Theor. Appl. Fract. Mech. Vol. 24 (1996), p.181.

[2] M. E. Kassener, T.A. Hayes: Int. Plasticity. Vol. 19 (2003), p.34.

[3] B. S. Lim, C. S. Jeong and Y.T. Keum, Met. Mater. - Int. Vol. 9 (2003), p.543.

[4] B. S. Lim, B. J. Kim, Key Eng, Mater. Vol. 306 (2006), p.1013.

[5] K. B. Yoon, K. W. Kim, U. B. Baek, J. KSME A. Vol. 22 (1998), p.2153.

[6] B. J. Kim, S. H. Ryu and B.S. Lim, Met. Mater. - Int. Vol. 9 (2004), p.19.

[7] S. Sasaki, Jpn J. Appl. Phys. Vol. 2 (1963), p.198.

[8] S. J. Song, Y. H. Kim, D. H. Bae, M. H. Jung and S. D. Kwon, IJMPB. Vol. 17 (2003), p.1653.

[9] H. C. Kim, J. K. Lee, S. Y. Kim and S. D. Kwon, Jpn. J. Appl. Phys. Vol. 38. Part1 (2001), p.260.

[10] S. D. Kwon, M. S. Choi and S. H. Lee, NDT & E International. Vol. 33 (2000), p.275.

[11] Y. H. Kim, S. J. Song, D. H. Bae and S. D. Kwon, Ultrasonics. Vol. 42 (2000), p.545.