Percolation-Relaxation Model with Critical Damage for Describing the Dynamic Tensile Spall of Ductile Metals


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In the framework of percolation theory, a simple void-coalescence model combined with the constitutive relations for describing the stress relaxation and material softening during the void-coalescence process, name as the percolation-relaxation (P-R) model, is proposed to describe the dynamic tensile spallation of ductile metals. A critical damage is introduced and coupled into the model to identify the onset of the void coalescence. Mesoscopically, the critical damage corresponds to the critical intervoid ligament distance (ILD), indicating the start of transition from the void-growth to the void-coalescence.



Key Engineering Materials (Volumes 324-325)

Edited by:

M.H. Aliabadi, Qingfen Li, Li Li and F.-G. Buchholz




Y. G. Wang et al., "Percolation-Relaxation Model with Critical Damage for Describing the Dynamic Tensile Spall of Ductile Metals", Key Engineering Materials, Vols. 324-325, pp. 121-124, 2006

Online since:

November 2006




[1] D. R. Curran, L. Seaman and D. A. Shockey : Phys. Rep. Vol. 147 (1987), pp.253-388.

[2] F. L. Addessio and J. N. Johnson : J. Appl. Phys. Vol. 74 (1993), pp.1640-48.

[3] P. F. Thomason: Acta mater. Vol. 47(1999), pp.3633-44.

[4] A. Strachan, T. Cağin and A. William : Phys. Rev. B Vol. 63 (2001), p.060103.

[5] E. T. Seppälä, J. Belak and R. E. Rudd : Phys. Rev. B Vol. 93 (2004), p.245503.

[6] D. Stauffer and A. Aharony : Introduction to the Percolation Theory. (Taylor and Francis London 1992).

[7] A. K. Zurek, W. R. Thissell, J. N. Johnson, D. L. Tonks, and R. Hixson : J. Mater. Process. Technol. Vol. 60 (1996), pp.261-7.

[8] S. Cochran and D. Banner : J. Appl. Phys. Vol. 48 (1977), pp.2729-37.

[9] Jiapo Feng, Fuqian Jing, and Guanren Zhang : J. Appl. Phys. Vol. 81 (1997), pp.2575-78.

[10] J. K. Mackenzie : Proc. Phys. Soc. Vol. A 224 (1950), pp.526-44.

[11] M. F. Horstemeyer, M. M. Matalanis, A. M. Sieber, M. L. Botos : Int. J. Plast. Vol. 16 (2000), pp.979-1015.