Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces


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Two different types of experimental methods have beeen developed for measuring lateral interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the type of direct measurement methods which typically utilize AFM instrumentations. In the direct lateral force measurements some size-scale effects are commonly observed due to the effects of adhesion and surface roughness. A recent development of a fine AFM lateral force calibration method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects systematically. The other type is the field projection method which requires a high resolution measurement of a deformation field near the edge of a contact. For such measurements a comprehensive map of deformation measurement techniques is introduced in a domain of spatial and strain resolutions. This technique provides a way of assessing the non-uniform distribution of the surface interaction forces for nano and micro-meter scale contacts.



Key Engineering Materials (Volumes 326-328)

Edited by:

Soon-Bok Lee and Yun-Jae Kim






K. S. Kim "Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces", Key Engineering Materials, Vols. 326-328, pp. 1-4, 2006

Online since:

December 2006





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