Application of Electric Addressing Spatial Light Modulator to the Moiré Measurement

Abstract:

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Based on the principle of moiré techniques, a new method combined with Electric Addressing SLM technique was proposed. The specimen grating is modulated by the SLM system, and its the frequency can be changed with aid of a 4f Fourier system. The moiré is generated by the overlapped specimen grating and a reference grating in the Fourier system. Typical test is conducted with a polyurethane beam. The successful results verify the feasibility of the method, and show its good potential of further application to the in-plane deformation measurement.

Info:

Periodical:

Key Engineering Materials (Volumes 326-328)

Edited by:

Soon-Bok Lee and Yun-Jae Kim

Pages:

147-150

DOI:

10.4028/www.scientific.net/KEM.326-328.147

Citation:

Q. Wang et al., "Application of Electric Addressing Spatial Light Modulator to the Moiré Measurement", Key Engineering Materials, Vols. 326-328, pp. 147-150, 2006

Online since:

December 2006

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Price:

$35.00

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