Design and Orthogonality Correction of a Planar Scanner for an Atomic Force Microscope

Abstract:

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This paper shows a method of designing a nano-positioning planar scanner that can be used in a scanning probe microscope. The planar scanner is composed of flexure guides, piezoelectric actuators and feedback sensors. Furthermore, we used a motion amplifying mechanism in the piezoelectric actuator to achieve a large travel range. We theoretically determined the travel range of the total system and verified the range by using a program based on a finite element analysis. The maximum travel range of the planar scanner was greater than 120 μm. A planar scanner of an atomic force microscope can move samples with a few nm resolutions. To get stable AFM images of small feature samples, a closed loop control could not be used due to large random errors of the sensor. The orthogonality of a new planar scanner having a motion guide is measured and corrected by using a simple electronic circuit in the open loop scanning to reduce the scanner artifact.

Info:

Periodical:

Key Engineering Materials (Volumes 326-328)

Edited by:

Soon-Bok Lee and Yun-Jae Kim

Pages:

401-404

DOI:

10.4028/www.scientific.net/KEM.326-328.401

Citation:

D. Y. Lee and D. G. Gweon, "Design and Orthogonality Correction of a Planar Scanner for an Atomic Force Microscope", Key Engineering Materials, Vols. 326-328, pp. 401-404, 2006

Online since:

December 2006

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Price:

$38.00

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[2] D.Y. Lee, D.M. Kim and D.G. Gweon: Jpn. J. Appl. Phys. Vo1. 45 (2006) No. 3B, p.2124.

[3] Dong-Yeon Lee and D.G. Gweon: J. Korean Phys. Soc. Vo1. 48 (2006) No. 3, p.363.

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