A Study on Identification of Bubble Movements in an Automatic Wheel Leakage Detection System


Article Preview

This paper describes a method to detect leaks on the surface of a wheel rim manufactured by aluminum die casting and forging. Leaks in the wheel rim may be caused by temperature gradient differences during the cooling period, impurities, or flowing air bubbles in the die casting process. We developed a new low-cost approach to detect leaks that only required a short inspection time by observing the movement of soap bubbles on the wheel rim surface. We designed new light sources to minimize mirror image effects and irregular luminance distributions on the curved wheel rim surface. A preprocessing procedure for image processing was also developed to determine the bubble configurations using threshold and morphology techniques. A series of experiments were conducted to evaluate the performance of the inspection system. The results demonstrated that leaks generated during the wheel rim manufacturing process could be accurately detected even under various environmental lighting conditions.



Key Engineering Materials (Volumes 326-328)

Edited by:

Soon-Bok Lee and Yun-Jae Kim




K. S. Boo et al., "A Study on Identification of Bubble Movements in an Automatic Wheel Leakage Detection System", Key Engineering Materials, Vols. 326-328, pp. 453-456, 2006

Online since:

December 2006




[1] N. Ikemoto and M. Isomura, On the Estimation of the Luminance Distrubution by the Diffuse Reflection Component of an Object's surface and Shape Measurement-Analysis by the Numerical Experiment, Journal of Light & Visual Environment, Vol. 28, No. 1, (2004).

DOI: https://doi.org/10.2150/jlve.28.1

[2] P. Ala-Laurila, et al., On the relation between the photo activation energy and the absorbance spectrum of visual pigments, Science Direct Vision Research, Vol. 44, pp.2153-2158, (2004).

DOI: https://doi.org/10.1016/j.visres.2004.03.031

[3] R.O. Dror, Surface reflectance and real-world illumination statistics, Ph.D. dissertation, Department of Electrical Engineering and Computer Science, MIT: Cambridge, MA, (2002).