Monocomponent Powders and Thin Films in the Binary System SiO2–TiO2


Article Preview

In this work, we report the sol-gel alkoxide route preparation of nanostructured SiO2 and TiO2 powders as well as TiO2-SiO2 thin films obtained by dip-coating. Thermal analysis, morphology and structure were characterized for powders and correlation between preparation method and optical properties of binary materials (SiO2-TiO2) for thin films was approached. Spectroscopic Ellipsometry (SE), Fourier Transform Infrared Spectroscopy (FTIR) and scanning electron microscopy (SEM) have been used for the physical characterization of the films.



Edited by:

Marc Anglada et al.




M. Gartner et al., "Monocomponent Powders and Thin Films in the Binary System SiO2–TiO2", Key Engineering Materials, Vol. 333, pp. 289-292, 2007

Online since:

March 2007




[1] C.J. Brinker and G.W. Scherer: Sol-gel science, the physics and chemistry of sol-gel processing (Academic Press, San Diego, CA, 1989).

[2] H. Schroeder, in: Physics in thin films: Advances in research and development, ed. G. Hass and R.E. Thun (Academic Press, New York, 1969) p.87.

[3] R.M. Almeida, X. Orignac and D. Barbier: J. Sol-Gel Sci. Technol. Vol. 2 (1994), p.465.

[4] M. Bahtat, J. Mugnier, C. Bovier, H. Roux and J. Serughetti: J. Non-Cryst. Solids Vols. 147&148 (1992), p.23.


[5] A.S. Holmes, R.R.A. Syms, M. Li and M. Green: Appl. Opt. Vol. 32 (1993), p.4916.

[6] B.D. Fabes, D.B. Birnie III and B.J.J. Zelinski: Thin Solids Films Vol. 254 (1995), p.175.

[7] A. Matsuda, Y. Matsuno, S. Katayama and T. Tsuno: J. Mater. Sci. Lett. Vol. 8 (1989), p.902.

[8] M. Shirkhanzadeh: J. Mater. Sci. Mater. Medicine Vol. 6 (1995), p.206.

[9] M. Atik, P. de Lima-Neto, L.A. Avaca, M.A. Aegerter and J. Zarzycki: J. Mater. Sci. Lett. Vol. 13 (1994), p.1081.

[10] M. Atik, P. de Lima-Neto, L.A. Avaca and M.A. Aegerter: Ceram. Int. Vol. 21 (1995), p.403.

[11] M. Zaharescu, C. Pirlog, M. Crisan, M. Gartner, M. Sahini and A. Vasilescu: Rev. Roum. Chim. Vol. 37 (1992), p.173.

[12] D.A.G. Bruggeman: Ann. Phys. Vol. 24 (1935), p.636.

[13] B. Yoldas: Appl. Opt. Vol. 21 (1982), p. (1982).