Microstructural Characterization of In Situ TiB Whiskers in Ti MMCs Fabricated by SPS

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The in situ TiB whisker reinforced titanium matrix composites were prepared by mechanical alloying followed by spark plasma sintering. X-ray diffraction, scanning electron microscopy and transmission electron microscopy were used to characterize the microstructure of the TiB whiskers. The effect of sintering temperature on morphologies of in situ TiB whiskers was evaluated. With the increase of spark plasma sintering temperature, the average diameter of in situ TiB whiskers increased. The in situ TiB whiskers exhibited a hexagonal shape with (100), (101) and (10 1 ) planes at the transverse section and a growth orientation of [010]TiB direction.

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Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

1310-1312

DOI:

10.4028/www.scientific.net/KEM.336-338.1310

Citation:

H. B. Feng et al., "Microstructural Characterization of In Situ TiB Whiskers in Ti MMCs Fabricated by SPS", Key Engineering Materials, Vols. 336-338, pp. 1310-1312, 2007

Online since:

April 2007

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$38.00

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