The Interface Reaction between an Ag+-Doped TiO2 Film and Stainless Steel Substrate


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Ag+-doped TiO2 films on stainless steel were prepared by a sol-gel method and their microstructures and compositions were studied with X-Ray Diffractometer, Scanning Electron Microscope (SEM) and X-ray Photoelectron Spectroscopy. It was shown that Fe atoms in untreated stainless steel react with Ag+ in the TiO2 film and form FeTiO3, which has an acicular crystal form under SEM observation. As a result, Ag+ in the film is reduced to the silver atom, which degrades the antibacterial property of the film. However, after an oxidization of the substrate, a layer of ferric oxide is formed, which reacts with Fe atoms that would otherwise react with and reduce Ag+, and then forms FeTiO3. Thus, the penetration of Fe atoms is stopped and Ag+ in the anatase-structure TiO2 film is protected from the reduction, which enhanced antibacterial property of the film.



Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong




X. G. Ding et al., "The Interface Reaction between an Ag+-Doped TiO2 Film and Stainless Steel Substrate", Key Engineering Materials, Vols. 336-338, pp. 1559-1562, 2007

Online since:

April 2007




[1] M. Kawashita, S. Tsuneyama and F. Miyaji: Biomaterials Vol. 21 (2000), p.393.

[2] O. Yoshio, I. Takashi and C. Abhijit: Applied Clay Science Vol. 18 (2001), p.123.

[3] O. Harizanov and A. Harizanova: Solar Energy Materials & Solar Cells Vol. 63 (2000), p.185.

[4] A. Sclafani: J. Phys. Chem. Vol. 94 (1990) p.829.

[5] M. Wang, X.G. Ding, X.D. Cao and H. Yang: Journal of Material Science and Engineering Vol. 21 (2003), p.379.

[6] J.W. Gao, X.G. Ding, S.Y. Huang, and H. Yang: Rare Metal Materials and Engineering Vol. 33 (2004), p.52.

[7] J.W. Gao, J.B. Wang, and H. Yang: Journal of the Chinese Ceramic Society Vol. 30 (2002), p.138.

[8] Y.F. Zhu and L. Zhang: Acta Chimica Sinica Vol. 58 (2000), p.467.

[9] G.J. Chi, S.W. Yao, and J. Fan: Surface and Coatings Technology Vol. 157 (2002), p.162.

[10] C. J. Lin and J. G. Duh: Thin Solid Films Vol. 287 (1996), p.80.

[11] H. P. Klug and L. E. Alexander: X-ray diffraction procedures (For poly-crystalline and amorphous materials) (John Wiley & Sons. Publications, Britain 1974).

[12] X.S. Niu, X. J. Wang, and H. Xu: Journal of Functional Materials and Devices Vol. 32 (2001), p.649.

[13] S.H. Liu, D.H. Wang, and C.H. Pan: Analyses of X-ray photoelectron spectroscopy (Science Press, P. R. China 1988).

[14] H. Yang, K. Wang, and X.G. Ding: Journal of the Chinese Ceramic Society Vol. 30 (2002), p.585.