Preparation and Characterization of CdSe/SiO2 Nanocomposites by Sol Gel Method and In Situ Growth

Abstract:

Article Preview

Transparent bulk CdSe/SiO2 nanocomposites, containing semiconductor CdSe nanocrystals well dispersed in silica glass matrix, were obtained by using sol-gel method and in-situ growth technique. The nanocomposites were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), UV-VIS absorption spectra and X-ray Photoelectron Spectroscopy (XPS). X-ray diffraction and transmission electron microscope measurements confirmed a cubic crystallographic structure of the nanoparticles, with mean diameter smaller than 10 nm. UV-VIS absorption spectra displayed a marked blue shift of the absorption band edge that was attributed to quantum confinement effects. XPS together with XRD proved that silica matrix plays an important role in enhancing the NCs’ stability.

Info:

Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

2275-2277

DOI:

10.4028/www.scientific.net/KEM.336-338.2275

Citation:

Y. X. Peng and M. Q. Wang, "Preparation and Characterization of CdSe/SiO2 Nanocomposites by Sol Gel Method and In Situ Growth", Key Engineering Materials, Vols. 336-338, pp. 2275-2277, 2007

Online since:

April 2007

Export:

Price:

$35.00

[1] R. Reisfeld: J. Alloy Comp. Vol. 341 (2002), p.56.

[2] Y.L. Yan, Y. Li, X.F. Qian, et al.: Mater. Sci. Eng. Vol. 103 (2003), p.202.

[3] Y. Wang, N. Herron: J. Phys. Chem. Vol. 91 (1987), p.257.

[4] Y. Asahara: Ceramics International. Vol. 23 (1997), p.375.

[5] S.H. Liu, X.F. Qian, J.Y. Yuan, et al.: Mater. Res. Bull. Vol. 38 (2003), p.1359.

[6] H. Liu, S. Wang, L. Zhang, X. Yao: J. Xi'an Jiaotong Univ. Vol. 29 (1995), p.13.

[7] Y.P. Wang, X. Yao, M.Q. Wang, et al.: J. Crystal Growth. Vol. 268 (2004) p.580.

[8] H.S. Nalwa: Handbook of Nanostructured Materials and Nanothechnology V. 4 (San Diego: Academic Press, c2000).

[9] J. E.B. Katari, V. L. Colvin, A. P. Alivisatos: J. Phys. Chem. Vol. 98 (1994).

In order to see related information, you need to Login.