Assessment of the Surface Morphology of Diamond Film Based on Fractal


Article Preview

The surface morphology of film material directly affects its physical performance. It is of great significance for finding out its prospective physical performance to characterize the surface morphology of film material. It is hard to characterize them with some conventional methods. The surface morphology of film material was described from the fractal point of view, and the dimension was correlated with the resistivity of material. The [100]-orientated diamond film was primarily investigated. The results show that the greater the crystal grain is, the more uniform and regular the orientation is; and the more compact the arrangement is, the greater the fractal box dimension is. Moreover, when fractal box dimensions were within a certain range approximately from 2.92 to 2.97, it presents positively correlative relation with the logarithm of resistivity, Log(ρ), which resembles the Logistic curve. However, when the other dimensions are beyond the range mentioned above, resistivity doesn’t change with the increase in dimensions of fractal. This study will conduce to illustrating the relationship between the structure of crystal exemplified by arrangement and physical performance as well as material preparation.



Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong




J. L. Lin et al., "Assessment of the Surface Morphology of Diamond Film Based on Fractal", Key Engineering Materials, Vols. 336-338, pp. 2543-2545, 2007

Online since:

April 2007




[1] Y. Wang, K.W. Xu: Acta Physica Sinica. Vol. 53 (2004), p.600.

[2] J.C. Russ: Fractal Surfaces (Kluwer Academic Publishers, Netherlands 1994).

[3] P. Meakin: Fractal, Scaling and Growth Far From Equilibrium (Cambridge Univ. Press, UK 1998).

[4] R F. Voss: Fundamental algorithms for computer graphics (Springer-Verlag, Berlin 1985). Fig. 3 The relation curve between D and Log(R).

Fetching data from Crossref.
This may take some time to load.