Microstructure and Optical Characterization of Au/SiO2 Nano-Composite Multilayer Films


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Au/SiO2 nano-composite multilayer thin films with different thickness were prepared on a quartz substrate by magnetron plasma sputtering. The microstructure, morphology and optical properties of the films were investigated by using TEM and optical absorption spectra. [Au/SiO2]×5 and [Au/SiO2] × 11 multilayer thin films have well-defined interface. The thickness of the multilayer was 60nm and 130 nm for the thin films with 5 and 11 layers, respectively. The optical absorption peaks due to the surface plasma resonance appeared at a wavelength of 560 nm for the both [Au/SiO2]×5 and [Au/SiO2]×11 thin films. The intensity of the absorption peak increased with increasing numbers of deposition layers. The optical absorption spectra of Au/SiO2 multilayer thin films are well agreement with the theoretical optical absorption spectra calculated from rewritten Maxwell–Garnett effective medium theory.



Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong




Y. Zhang et al., "Microstructure and Optical Characterization of Au/SiO2 Nano-Composite Multilayer Films", Key Engineering Materials, Vols. 336-338, pp. 2575-2578, 2007

Online since:

April 2007




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