Preparation and SEM of Ni/Ce-YSZ Anode Materials


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Gelcasting and dry pressing are used to produce anode composites for SOFC. In this paper a composite material Ni/Ce-YSZ containing Ni and Ce-doped Y2O3-stabilized ZrO2 (Ce-YSZ) based on Ce-YSZ electrolyte was fabricated via sintering infiltration of NiO at the temperature of 1400°C, followed Ni/Ce-YSZ materials are successfully produced by reduction- sintering process. Hydrogen reduction of NiO in the NiO/Ce-YSZ anode material was accomplished successfully through pore channels of debinded carbon volume. XRD results suggest that a solid solution of Ce-YSZ was produced. The microstructure of NiO/Ce-YSZ, and Ni/Ce-YSZ material was observed by SEM. This study confirms that sintering infiltration of NiO is a viable process for fabricating anode materials based on zirconia electrolyte and there are a good interface between electrolyte and anode.



Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong




J. T. Ma et al., "Preparation and SEM of Ni/Ce-YSZ Anode Materials", Key Engineering Materials, Vols. 336-338, pp. 387-390, 2007

Online since:

April 2007




[1] N.Q. Minh: J. Am. Ceram. Soc., Vol. 76 (1993), p.563.

[2] M. Marinsek, K. Zupan, J. Maeek: J. Power Sources, Vol. 106 (2002), p.178.

[3] C. Xia, M. Liu: Solid State Ionics, Vol. 144 (2001), p.249.

[4] S. Ohara, R. Maric, X. Zhang, K. Mukai, T. Fukui, H. Yoshida, T. Inagaki, K. Miura: J. Power Sources, Vol. 86 (2000), p.455.

[5] S. -G. Kim, S.P. Yoon, S.W. Nam, S. -H. Hyun: J. Power Sources, Vol. 110 (2002), p.222.

[6] A. Tsoga, A. Naoumidis, D. Stover: Solid State Ionics, Vol. 135 (2000), p.403.

[7] V. Esposito, D.Z. de Florio, F.C. Fonseca, E.N.S. Muccillo, R. Muccillo, E. Traversa: J. Eur. Ceram. Soc., Vol. 25 (2005), p.2637.

[8] A. Kuzjukevics, S. Linderoth: Solid State Ionics, Vol. 93 (1997), p.255.

[9] Z.C. Xia, Z.Q. Tang, X.L. Pan, X.L. Qian: J. Funct. Mater., Vol. 28 (1997), p.455.

[10] D. Simwonis, F. Tietz, D. Stover: Solid State Ionics, Vol. 132 (2000), p.241.