Microstructural and Micromorphological Studies on ZnSe Single Crystals Using AFM/FE-SEM/RO-XRD

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The microstructure and surface micromorphology of ZnSe single crystals grown directly from zinc and selenium have been investigated using rotation orientation x-ray diffraction (RO-XRD), atomic force microscope (AFM) and field emission scanning electron microscope (FE-SEM). The ZnSe samples exhibit only the surface leaning to (111) singular face by the angle of 3.13°, which is the buildup of two-dimensional dendritic crystal layers. Numerous nuclei and cavities distribute unevenly across the crystal surface, governing the formation of growth layer, while the dendritic crystal layers develop rapidly by margining the smaller nuclei. The formation of these microstructure and micromorphology on the surface of ZnSe crystals depends on the surface supersaturation and the growth parameters.

Info:

Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

633-636

DOI:

10.4028/www.scientific.net/KEM.336-338.633

Citation:

H. Y. Li et al., "Microstructural and Micromorphological Studies on ZnSe Single Crystals Using AFM/FE-SEM/RO-XRD", Key Engineering Materials, Vols. 336-338, pp. 633-636, 2007

Online since:

April 2007

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Price:

$35.00

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