Key Engineering Materials
Vols. 364-366
Vols. 364-366
Key Engineering Materials
Vols. 361-363
Vols. 361-363
Key Engineering Materials
Vols. 359-360
Vols. 359-360
Key Engineering Materials
Vols. 353-358
Vols. 353-358
Key Engineering Materials
Vol. 352
Vol. 352
Key Engineering Materials
Vol. 351
Vol. 351
Key Engineering Materials
Vol. 350
Vol. 350
Key Engineering Materials
Vols. 348-349
Vols. 348-349
Key Engineering Materials
Vol. 347
Vol. 347
Key Engineering Materials
Vols. 345-346
Vols. 345-346
Key Engineering Materials
Vol. 344
Vol. 344
Key Engineering Materials
Vols. 342-343
Vols. 342-343
Key Engineering Materials
Vols. 340-341
Vols. 340-341
Key Engineering Materials Vol. 350
DOI:
ToC:
Paper Title Page
Abstract: The effects of SnO2 addition on the electrical degradation characteristics of Bi2O3-MnO2-Co3O4 -added
ZnO varistors were investigated by field-emission scanning electron microscopy (FE-SEM),
energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), and voltage-current (V-I)
characteristics. The ZnO grain size was made uniform by the addition of SnO2 or Sb2O3. The
nonlinearity index α of the V-I characteristic for Bi-Mn-Co-SnO2-added samples was approximately 50
and the varistor voltage was 120~140V/mm. The value of α after the electrical degradation showed a
local maximum at approximately 0.1mol% added SnO2 and then showed a local minimum at
approximately 0.5mol%, similar to the relative integral intensity of the XRD diffraction peak for the
(004) plane for a small amount of SnO2 added. It is suggested that the diffusion of oxygen ions through
the grain boundary is affected by the change in crystal orientation of ZnO grains at the grain boundary
induced by the addition of a small amount of SnO2.
213
Abstract: Laminar-type thin-film ZnO varistors were fabricated on sintered alumina substrates using visible
light (532nm) pulsed laser deposition (PLD). The structure of the laminar-type thin-film varistor is
Ni / Co-added ZnO / impurity layer / Co-added ZnO / Ni. Many droplets were observed on the
deposited Bi2O3+MnO2 compared with the deposited Co-added ZnO thin film. Moreover, for
droplets on the Bi2O3+MnO2 layer, the content of Mn was higher than that of Bi. The V-I
characteristics of the deposited ZnO+CoCl2 or Bi2O3+MnO2 thin film were ohmic. However, V-I
characteristics of laminar-type thin film including the Bi2O3+MnO2 impurity layer deposited for
30min showed nonlinearity. The non linearity index α was approximately 2 and the varistor voltage
was approximately 1V. Thermal annealing in N2 gas atmosphere at 700°C for 10 min was carried out
to improve the crystallinity of the thin film. After annealing, both the varistor voltage and the current
at which nonlinearity appeared decreased. Moreover, the value of non linearity index α was
approximately 2.8.
217
Abstract: We investigated the magnetic and dielectric properties of a metal (Pt)/insulator
(Cr2O3)/semiconductor (Si) (MIS) capacitor composed of magneto-electric (ME) materials. The
capacitor has anti-ferromagnetic properties and a very small electrically induced magnetic moment.
It also shows capacitance-voltage (C-V) properties typical of a Si-MIS capacitor without any
hysteresis. By inserting a thin Cr2O3-x layer, the C-V curve has a hysteresis window with a
clockwise trace, which indicates that electrons have been injected into the Cr2O3-x layer. These
results indicate that this MIS capacitor contains a floating gate and an ME insulating layer in a
single system.
221
Abstract: Various factors were investigated to decide the mechanical properties of (Mn1–xNix)3O4 ceramics,
that are typical composition systems of NTC (negative temperature coefficient) thermistors. The
strength of NTC thermistor ceramics can be improved by designing the material so that the
compressive stress may remain at the surface of the ceramics. At high temperature, the thermal
expansion coefficient of a rock salt phase segregated internally ceramic increases over that of the
spinel phase, further, on the surface of the ceramics, this compressive stress remains below room
temperature. Moreover, it was confirmed that the stress analysis result by the FEM corresponded
well with the stress measurement result on the surface of the ceramics measured by μ -XRD.
229
Abstract: Zinc oxide (ZnO) ceramics was coupled and reacted with alpha aluminum oxide (α-Al2O3)
ceramics at 1200oC for 24 h. SEM observation and energy dispersive X-ray spectroscopy (EDS)
analysis revealed the existence of diffusion layer of 10 μm thickness on the α-Al2O3 side of
interface between ZnO and α-Al2O3. The diffusion layer is considered to consist of a ZnAl2O4, from
the result of XRD. The cathodoluminescence of the diffusion layer was compared with that of zinc
aluminate (ZnAl2O4) ceramics synthesized by conventional solid state reaction method. The single
phase ZnAl2O4 showed weak emission peaked at 4.6 eV. On the other hand, the diffusion layer
showed intense emission peaked at 3.75 eV. The ZnAl2O4 on the α-Al2O3 side of the interface
synthesized by coupling of ZnO and α-Al2O3 is considered to be a excellent material as an
ultraviolet light emitter.
233
Abstract: The frequency dependences of the complex permeability μ
r*, complex permittivity ε
r*, and return
loss were investigated for composite electromagnetic wave absorbers made of soft magnetic
materials (permalloy or sendust) and polystyrene resin. For permalloy, two types of particle shape
were used: grain-type or flake-type. The volume mixture ratio of magnetic materials was varied in
the range from 40 % to 70 %. The values of the real part μ ’ and imaginary part μ ” of μ
r
* increased
with increasing mixture ratio of magnetic materials. The frequency dependence of μ
r
* for flake-type
permalloy composite was similar to that for sendust composite. All absorbers showed the absorption
of electromagnetic waves in the frequency range above 1 GHz.
239
Abstract: Direct observations for high frequency microscopic dielectric distributions in cross sections of a multi-layer
ceramic capacitor were carried out using non-contact type microwave probe. The measured data were imaged
from the raw data and rounding data process. Using microwave reflection intensity mappings from cross sections
of multi-layer ceramic capacitor, the dielectric permittivity distribution in micro-region of a multi-layer ceramic
capacitor was measured at room temperature. The spatial resolution was experimentally estimated to be about 10
μm from mappings of the dielectric and inner electrode layers in a multi-layer ceramic capacitor.
243