Characterization of Mechanical Properties of Brittle Coating Systems by Various Indentation Techniques


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The mechanical properties of brittle coating structures were characterized by various indentation techniques. The adhesion properties of the coatings were evaluated by in situ scratch and sphere indentation method. Physical vapor deposited TiN coatings on transparent substrates, sapphire, were scratched by diamond cone indenter and in situ observed through the transparent substrate. In situ scratch results reveal that the failure of coating is originated from the damage of the substrate and the plastic deformation of substrate is a primary factor for determining the adhesion breakage. The unique characterization technique for the strength measurement of brittle thin coating has been developed. The strength of the thin coating was evaluated by the sphere indentation on the trilayer structure. The CVD SiC coatings on graphite were characterized by the technique. It is concluded that the microstructure of SiC coatings influences the strength. In this paper, the various indentation technique were applied to evaluate the mechanical properties of TiN and SiC coatings and the effect of microstructure on the reliability of the brittle coating system was discussed.



Edited by:

Katsutoshi Komeya, Yohtaro Matsuo and Takashi Goto




J. H. Kim et al., "Characterization of Mechanical Properties of Brittle Coating Systems by Various Indentation Techniques", Key Engineering Materials, Vol. 352, pp. 53-58, 2007

Online since:

August 2007




[1] W. J. Clegg, K. Kendall, N. M. Alford, T. W. Button and J. D. Birchall, Nature, 347 (1990), 455-457.

[2] B. R. Lawn, K. S. Lee, H. Chai, A. Pajares, D. K. Kim, S. Wuttiphan, I. M. Peterson and X. Z. Hu, Advanced Engineering Materials, 2 (2000), 745-748.

DOI: 10.1002/1527-2648(200011)2:11<745::aid-adem745>;2-e

[3] J. H. Kim, P. Miranda, D. K. Kim and B. R. Lawn, Journal of Materials Research, 18 (2003), 222-227.

[4] O. Kraft and C. A. Volkert, Advanced Engineering Materials, 3 (2001), 99-110.

[5] B. R. Lawn, Y. Deng, P. Miranda, A. Pajares, H. Chai and D. K. Kim, Journal of Materials Research, 17 (2002), 3019-3036.

[6] C. S. Lee, J. H. Kim and D. K. Kim, Advanced Ceramics and Composites, 247 (2003), 287-292.

[7] K. S. Lee, S. K. Lee, B. R. Lawn and D. K. Kim, Journal of the American Ceramic Society, 81 (1998), 2394-2404.

[8] D. J. Kim, D. J. Choi and Y. W. Kim, Thin Solid Films, 266 (1995), 192-197.

[9] J. H. Kim, H. K. Leey and D. K. Kim, Philosophical Magazine, 86 (2006), 5383-5396.

[10] Y. G. Kim and D. K. Kim, Journal of Materials Research, 20 (2005), 1389-1395.

[11] F. S. Shieu, L. H. Cheng, Y. C. Sung, J. H. Huang and G. P. Yu, Thin Solid Films, 334 (1998), 125-132.

[12] C. A. Schuh, C. E. Packard and A. C. Lund, Journal of Materials Research, 21 (2006), 725-736.

[13] R. Nowak, T. Sekino and K. Niihara, Acta Materialia, 47 (1999), 4329-4338.

[14] N. I. Tymiak, A. Daugela, T. J. Wyrobek and O. L. Warren, Acta Materialia, 52 (2004), 553-563.

DOI: 10.1016/j.actamat.2003.09.039

[15] J. H. Oh, B. J. Oh, D. J. Choi, G. H. Kim and H. S. Song, Journal of Materials Science, 36 (2001), 1695-1700.

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