Microstructure and Optical Properties of Ag/TiO2 Multilayers


Article Preview

The microstructure of Ag/TiO2 and Ag/Ti/TiO2 multilayer system are investigated by AFM and TEM, and their interfaces are analyzed by the means of spectroscopic ellipsometry (SE). The results show that the multilayer has a sharp interface without interdiffusion and interface reaction products. AFM surface roughness analysis indicates a 2-nm titanium transition layer can improve surface quality of silver films, because it is enabled to change silver island dimension and distribution and improve coverage of silver films on Ti/TiO2 substrate. This can be attributed to titanium ׳s strong oxygen affinity and good wettability to titanium dioxide. The optical properties test of TiO2/Ag/TiO2 multilayer demonstrates surface plasma resonance (SPR) absorption shifts towards long wave region with the increasing of the total thickness of dielectrics.



Key Engineering Materials (Volumes 353-358)

Edited by:

Yu Zhou, Shan-Tung Tu and Xishan Xie




Z. G. Wang and X. Cai, "Microstructure and Optical Properties of Ag/TiO2 Multilayers", Key Engineering Materials, Vols. 353-358, pp. 1724-1728, 2007

Online since:

September 2007




[1] X.J. Liu, X. Cai, et al.: Thin Solid Films Vol. 441 (2003), pp.200-206.

[2] Z.G. Wang, Q.L. Chen, X. Cai: Appl. Surf. Sci. in press.

[3] J.A. Mejías, V. M. Jime´nez, et al.: J. Phys. Chem. Vol 100 (1996), pp.16255-16262.

[4] Yuko Tachibana et al.: Thin Solid Films Vol. 442 (2003), pp.212-216.

[5] J.J. Finley: Thin Solid Films Vol. 351 (1999), pp.264-273.

[6] X.J. Liu, X. Cai, et al.: Appl. Surf. Sci. Vol. 183 (2001), pp.103-110.

[7] H. C. Kim, T. L. Alford: Appl. Phys. Lett. Vol. 81(22) (2002), p.4287.

[8] K. Sieradzki, K. Bailey, T. L. Alford: Appl. Phys. Lett. Vol. 79(21) (2001).

[9] Y.X. Zeng, T. L. Alford, Y. L. Zou: J. Appl. Phys. Vol. 83 (2) (1998), p.779.

[10] Y.X. Zeng, Y. L. Zou and T. L. Alford: J. Appl. Phys. Vol. 81 (12) (1997), p.7773.

[11] P.B. Johnson, R.W. Christy: Phys. Rev. B Vol. 6(12) (1972), p.4370.

[12] K. Zakrzewska et al.: Solid State Ionics Vol. 157 (2003), pp.349-356.

[13] C. Su, J. -C. Yeh, J. -L. Lin et al.: Appl. Surf. Sci. Vol. 169-170 (2001), pp.366-370.

[14] G. Lassaletta, A. Fernandez et al.: Journal of Electron spectroscopy and related phenomena Vol. 87 (1997), pp.61-71.

[15] Y. Takahashi, Y. Tsunematsu et al.: Vacuum Vol. 45(1) (1994), pp.103-108.

[16] T. Tepper et al.: Materials letters Vol. 33 (1997), pp.181-184.

[17] Rémi Larzzari, Jacques Jupille: Surf. Sci. Vol. 482-485 (2001), pp.823-828.

[18] C.T. Campbell: Surf. Sci. Rep. Vol. 27 (1997), p.1.

[19] U. Diebold. Surf. Sci. Rep. 48(2003) 53-229.

[20] P.J. McMarr, K. Vedam, J. Narayan. J. Appl. Phys. 59 (3) (1986)694-701.