Surface Morphology, Crystal Orientation and Scratch Properties of Au/NiCr/Ta Multi-Layered Metallic Films


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The crystal orientation, surface morphology, surface roughness and scratch properties of Au/NiCr/Ta multi-layered metallic films was examined by X-ray diffraction (XRD), atomic force microscopy (AFM) and a scratch test method, respectively. It was clarified that the surface morphology and surface roughness depend on the substrate temperature. The surface roughness decreases from 4.259nm to 2.935nm when substrate temperature changed from 100°C to 180°C, and then increases when substrate temperature above 180°C. The XRD revealed that there are only Au diffraction peaks with highly textured having a Au-(111) or a mixture of Au-(111) and Au-(200) orientation. The micro-scratch test reveals that both modes can be used for conventionally critical load determination, but the friction mode can additionally reflect the changes at different metallic film layers, the critical characteristic load was not sensitive to substrate temperature.



Key Engineering Materials (Volumes 353-358)

Edited by:

Yu Zhou, Shan-Tung Tu and Xishan Xie




W. Tang et al., "Surface Morphology, Crystal Orientation and Scratch Properties of Au/NiCr/Ta Multi-Layered Metallic Films ", Key Engineering Materials, Vols. 353-358, pp. 1863-1866, 2007

Online since:

September 2007




[1] S. S. Lin, J. L. huang and D. F. Lii: Surf. Coat. Technol Vol. 190 (2005), P. 372.

[2] H. Han, D. Adams, J. W. Mayer and T. L. Alford: J. Appl. Phys. Vol. 98 (2005), P. 083705.

[3] J. E. Gray, P. R. Norton and K. Griffiths: Thin Solid Films Vol. 484 (2005), P. 196.

[4] J. G. Jin, S. K. Lee and Y. H. Young: Thin Solid Films Vol. 466 (2004), P. 272.

[5] I. Demirci, C. Gauthier and R. Schirrer: Thin Solid Films Vol. 479 (2005), P. 207.

[6] Z. Q. Yao, P. Yang, N. Huang, H. Sun and J. Wang: Appl. Surf. Sci. Vol. 230 (2004), P. 172.

[7] D. F. Arias, Y. C. Arango and A. Devia: Appl. Surf. Sci. Vol. 252 (2005), P. 1175.

[8] Y. G. Yang, D. D. Hass and H. N. G. Wadley: Thin Solid Films Vol. 471 (2005), P. 1.

[9] Y. Enomoto and M. Taguchi: Appl. Surf. Sci. Vol. 244 (2005), P. 213.

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