Adhesion Test of Nanostructured Materials by a Novel AFM Probe

Abstract:

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We have developed a novel atomic force microscope (AFM) probe as a highly sensitive sensor and an application of the probe into various mechanical tests for characterizing micro/nanostructures. Using MEMS fabrication technique, we have designed and fabricated rhombus-shaped symmetric AFM probe. Adhesion forces between silicon tip and artificial nano-hair structures of cyclic olefin copolymer (COC) and polypropylene (PP) were measured using the probe with a flat tip. The results exhibited the usual characteristics of force-displacement curves of COC and PP nano-hair structures, in which a pull-off force was detected at the point of unloading. The average adhesion forces of the COC and PP hair structures are about 9.48 μN and 10.67 μN, respectively.

Info:

Periodical:

Key Engineering Materials (Volumes 353-358)

Edited by:

Yu Zhou, Shan-Tung Tu and Xishan Xie

Pages:

2253-2256

DOI:

10.4028/www.scientific.net/KEM.353-358.2253

Citation:

H. J. Lee et al., "Adhesion Test of Nanostructured Materials by a Novel AFM Probe", Key Engineering Materials, Vols. 353-358, pp. 2253-2256, 2007

Online since:

September 2007

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Price:

$35.00

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