Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification

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Periodical:

Key Engineering Materials (Volumes 364-366)

Edited by:

Guo Fan JIN, Wing Bun LEE, Chi Fai CHEUNG and Suet TO

Pages:

555-559

Citation:

K. Hu et al., "Recognition of MEMS Microstructure Feature Based on Pattern Analysis and Classification", Key Engineering Materials, Vols. 364-366, pp. 555-559, 2008

Online since:

December 2007

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$38.00

[1] L. Singleton, R.K. Leach, Z. Cui and A.J. Lewis: 2003 Report on the analysis of the MEMSTAND survey on standardization for Microsystems technology 1-31(2003). on http: /www. memstand. org.

[2] B. Fisher, S. Perkins, A. Walker, E. Wolfart: HyperMedia Image Processing Reference (HIPR), (Wiley, New York 1997).

[3] P. Kahn, L. Kitchen, and M. Riseman: Journal of IEEE Trans. Pattern Analysis and Machine Intelligence, 12(11) (1990), p.1098.

[4] V. Venkateswar, R. Chellapa: IEEE Trans. on PAMI, Vol. 14(1992), p.1111.

[5] D. Lagunovsky: Pattern Recognition Letters, 20(1999), p.1005.

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