Dielectric Properties of Zr-Doped CaCu3Ti4O12 Ceramics
CaCu3(Ti1-xZrx)O12 ceramics (x = 0.02, 0.04, 0.06, 0.08) were prepared by the conventional solid-state reaction method. Phase compositions, microstructure and dielectric properties were examined by XRD, SEM and impedance spectroscopy, respectively. The experimental results indicated that there is no obvious effect on microstructure characteristic by substituting Zr4+ for Ti4+. It was found that the values of the dielectric constant for all of the samples dropped into the order of 102, which is significantly lower than the order of 105 that of normally reported in the literature. It was suggested that the presence of impurity phases played an important role for the degeneracy of dielectric properties.
Wei Pan and Jianghong Gong
Y. He et al., "Dielectric Properties of Zr-Doped CaCu3Ti4O12 Ceramics", Key Engineering Materials, Vols. 368-372, pp. 129-131, 2008