Interfacial Behavior of SiC-Based Boundary Layer Capacitors

Abstract:

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SiC-based boundary layer capacitors were prepared by hot pressing. XRD, TEM and the high-resolution TEM techniques were used to characterize the sintered samples. It was found that the width of the grain boundary within the SiC-based boundary capacitors was about 200 nm. Extremely high dielectric constant of >2,400,000 appeared in a wide temperature range from 590oC to 730oC, with the maximum of >2,900,000. The critical temperature was about 500oC. Space charge polarization was detected as the temperature increased. Nano grains in the boundary phase were observed, which might enhance the space charge behavior.

Info:

Periodical:

Key Engineering Materials (Volumes 368-372)

Edited by:

Wei Pan and Jianghong Gong

Pages:

235-237

DOI:

10.4028/www.scientific.net/KEM.368-372.235

Citation:

R. Zhang et al., "Interfacial Behavior of SiC-Based Boundary Layer Capacitors", Key Engineering Materials, Vols. 368-372, pp. 235-237, 2008

Online since:

February 2008

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Price:

$35.00

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