XPS Research on SrTiO3-Based Voltage-Sensitive Material

Abstract:

Article Preview

SrTiO3-based voltage-sensitive material was prepared successfully. The structure and properties were investigated using scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy. It was observed that the average grain size was greater than 3μm and a cubic perovskite structure was obtained. XPS analysis of oxygen indicated that there existed multiform chemical state oxygen at the surface of the grain. Further researches shown that there were a few [AO12] polyhedrons and many cation vacancies in the material discussed, which demonstrated that a lot of oxygen volatilized and a well-known semiconductivity level was achieved.

Info:

Periodical:

Key Engineering Materials (Volumes 368-372)

Edited by:

Wei Pan and Jianghong Gong

Pages:

535-537

DOI:

10.4028/www.scientific.net/KEM.368-372.535

Citation:

Y. X. Xu et al., "XPS Research on SrTiO3-Based Voltage-Sensitive Material", Key Engineering Materials, Vols. 368-372, pp. 535-537, 2008

Online since:

February 2008

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.