Preparation and Characterization of Poly Amide Amine (Generation 4.0) Self-Assembled Monolayer on Si (100)

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The fourth generation of poly amide amine molecular self-assembled monolayer (PAMAM (G4.0)-SAM) was prepared on hydroxylated Si (111) substrate by a self-assembled technique from specially formulated solution. The PAMAM (G4.0)-SAM were characterized by means of contact angle measurement, ellipsometry, X-ray photoelectron spectroscope (XPS), and atomic force microscopy (AFM). The tribological properties of the as-prepared thin films sliding against a steel ball were evaluated on a friction and wear tester. The tribological results show that the friction coefficient of monocrystal line silicon substrate reduces from 0.6 to 0.18 due to the formation of PAMAM-SAMs on its surface. And the PAMAM (G4.0) -SAM has longer wear life (18000 sliding pass). It is demonstrated that PAMAM (G4.0) -SAM exhibited good wear resistant property. In conclusion, the PAMAM (G4.0)-SAM which possesses good wear resistant property was successfully prepared and the film.

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Periodical:

Key Engineering Materials (Volumes 373-374)

Main Theme:

Edited by:

M.K. Lei, X.P. Zhu, K.W. Xu and B.S. Xu

Pages:

645-648

DOI:

10.4028/www.scientific.net/KEM.373-374.645

Citation:

B. F. Cui et al., "Preparation and Characterization of Poly Amide Amine (Generation 4.0) Self-Assembled Monolayer on Si (100)", Key Engineering Materials, Vols. 373-374, pp. 645-648, 2008

Online since:

March 2008

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$35.00

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