On-Machine Measurement for Touch-Trigger Probes and its Error Compensation

Abstract:

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This paper advances a method to implement the on-machine measurement (OMM) with the touch-trigger probe, also called switching probes. Some of the advantages and disadvantages for touch-trigger probe are discussed. However, the touch-trigger probe errors exist and become one of the major errors for the measurement accuracy. Major factors that influence the probe measurement have been analyzed. The basic technique of probe measurement error modeling with artificial neural network was researched, and also the probe measurement error compensation with 3-layered backpropagation artificial neural network was presented. At last in the experimental system composed of DIXI 50 machining center, Fanuc 16i control system, Blum CNC P82.046 probe and PC, valid the correlated techniques. In addition, the connection and communication between the machining center equipped with probe system and the computer have been introduced. The experiment indicated that, using the touch-trigger probe makes on-machine measurement more automatic and efficient. And by using the back-propagation neural network for error compensation make on-machine measurement more precise.

Info:

Periodical:

Key Engineering Materials (Volumes 375-376)

Edited by:

Yingxue Yao, Xipeng Xu and Dunwen Zuo

Pages:

558-563

DOI:

10.4028/www.scientific.net/KEM.375-376.558

Citation:

X. M. Qian et al., "On-Machine Measurement for Touch-Trigger Probes and its Error Compensation ", Key Engineering Materials, Vols. 375-376, pp. 558-563, 2008

Online since:

March 2008

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Price:

$35.00

[1] S.D. Chen and C. Zhang: Journal of Mechanical Design, Vol. 125 (2003), pp.830-839.

[2] S.H. Kim and D.H. Kim: J. Kor. Soc. Precis. Eng., Vol. 18 (2001) No. 6, pp.9-18.

[3] J.P. Choi and S.J. Lee: Proceedings of the Conference on Positioning Technology (Korea, 2002), pp.230-234.

[4] W.Z. Adam and D. Marek: Precision Engineering, Vol. 29 (2005), pp.290-297.

[5] J.P. Choi, B.K. Minb and S.J. Lee: Journal of Materials Processing Technology Vol. 155 (2004), p.2056-(2064).

[6] C. Butler: Ind Metrology, (2001) No. 2, pp.59-70.

[7] D. Marek and W.Z. Adam: Precision Engineering, Vol. 29 (2005), pp.281-289.

[8] Q. Yang, C. Butler and P. Baird: Measurement, Vol. 18 (2000) No. 1, pp.47-57.

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