Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures

Abstract:

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This paper presents a study of effect of cutting conditions on surface quality in FTS machining of optical microstructures such as micro-lens array. A power spectrum analysis is proposed to characterize the surface quality in FTS machining. It is found that there is a strong relationship between the surface roughness and the power spectrum of the surface profile. This provides an important means for the characterization of surface quality in FTS machining of optical microstructures.

Info:

Periodical:

Key Engineering Materials (Volumes 381-382)

Edited by:

Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek

Pages:

517-520

DOI:

10.4028/www.scientific.net/KEM.381-382.517

Citation:

C. F. Cheung, T. C. Kwok, S. To, W. B. Lee, X. Q. Jiang, H.F. Li, "Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures", Key Engineering Materials, Vols. 381-382, pp. 517-520, 2008

Online since:

June 2008

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Price:

$35.00

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