Refractive Index and Thickness Determinations Using a Dual-Path Mach-Zehnder Interferometer

Abstract:

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This paper introduces a dual-path Mach-Zehnder interferometer for determining refractive index and geometrical thickness of an optical plate. In this interferometer, two parallel incident beams are separated into two interference pairs which are then recombined to generate two interference signals. An optical plate is placed on the path of one wave of an interference pair, so the phase difference of the interference signals is a function of the plate, and the interferometer is thus able to determine the index and thickness of the plate. A setup constructed to realize the proposed interferometer is described. And the experimental results of applying this setup agree the validity of the interferometer.

Info:

Periodical:

Key Engineering Materials (Volumes 381-382)

Edited by:

Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek

Pages:

97-100

DOI:

10.4028/www.scientific.net/KEM.381-382.97

Citation:

S. T. Lin and T.L. Lin, "Refractive Index and Thickness Determinations Using a Dual-Path Mach-Zehnder Interferometer", Key Engineering Materials, Vols. 381-382, pp. 97-100, 2008

Online since:

June 2008

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Price:

$35.00

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