Measurement Technology and Intelligent Instruments VIII

Volumes 381-382

doi: 10.4028/www.scientific.net/KEM.381-382

Measurement Technology and Intelligent Instruments VIII

Description:

Volume is indexed by Thomson Reuters BCI (WoS).
Measurement, rigorously defined as ‘ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory’, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering.
This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.

Keywords:
The 163 peer-reviewed papers in this book include contributions from all over the world, including Australia, Austria, China, Croatia, Egypt, France, Germany, Hungary, Japan, Mexico, Poland, the Republic of Korea, Russia, Singapore, Spain, Taiwan, Turkey, the UK, the USA and Vietnam.
This work certainly presents the most up-to-date information on the use of measurement technology and intelligent instrumentation in areas ranging from basic research to industrial manufacture.

Review from Ringgold Inc., ProtoView: Gao (nanomechanics, Tohoku U., Japan), Yasuhiro Takaya (nanomechanics, Osaka U., Japan), Yongsheng Gao (nanomechanics, Hong Kong U. of Science and Technology) and Michael Krystek (nanomechanics, Physikalisch Technische Bundesanstalt) have edited this collection of 163 research articles on new measurement technologies in the manufacturing sector, combining both basic research projects with applied systems already used in industry. Written for fellow engineers and students in manufacturing sciences and nanotechnology, these papers cover such topics as micro and nano-metrology, precision measurement advances, online and in-process measurement, surface metrology, optical metrology and image processing, biomeasurement, sensor technology and intelligent measurement and instrumentation. The latest methods of signal processing and associated algorithms are also discussed.

Info:

ISBN-13:
978-0-87849-382-1
Editors:
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek
Pages:
674
Year:
2008

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