Local Investigation of Microstructure-Induced Fatigue Damaging

Abstract:

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From the emission of dislocations till short crack propagation fatigue is a local process determined by the microstructure. In this paper we present experiments based on refined applications of the scanning electron microscope and focused ion beam technique, which give detailed information about crack initiation and the interaction of short fatigue cracks with microstructural elements.

Info:

Periodical:

Key Engineering Materials (Volumes 417-418)

Edited by:

M.H Aliabadi, S. Abela, S. Baragetti, M. Guagliano and Han-Seung Lee

Pages:

521-524

DOI:

10.4028/www.scientific.net/KEM.417-418.521

Citation:

M. Marx et al., "Local Investigation of Microstructure-Induced Fatigue Damaging", Key Engineering Materials, Vols. 417-418, pp. 521-524, 2010

Online since:

October 2009

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Price:

$35.00

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