Technology Evolution for Silicon Nano-Electronics

Volume 470

doi: 10.4028/

Paper Title Page

Authors: Hiroyoshi Itoh, Syuta Honda, Junichiro Inoue

Abstract: The electronic structures of Co-based Heusler alloys with nonstoichiometric atomic compositions as well as those at the interface of...

Authors: Masahiro Tamura, Jun Nakamura, Akiko Natori

Abstract: Dielectric properties of α-quartz and rutile-GeO2 thin-films are investigated using first-principles ground-state calculations in external...

Authors: Masato Senami, Yuji Ikeda, Takaaki Hara, Akitomo Tachibana

Abstract: In this article, we propose two analysis method using novel local quantities. One method is related to the dynamics of electron spin. This...

Authors: Tomohisa Mizuno, Mitsuo Hasegawa, Toshiyuki Sameshima

Abstract: We have studied new abrupt-source-relaxed/strained semiconductor-heterojunction structures for quasi-ballistic...

Authors: Hai Gui Yang, Masatoshi Iyota, Shogo Ikeura, Dong Wang, Hiroshi Nakashima

Abstract: Al2O3 deposition and subsequent post-deposition annealing (Al2O3-PDA) is proposed as an effective method to passivate electrically active...

Authors: Hiroki Kondo, Masaru Hori, Wakana Takeuchi, Mineo Hiramatsu

Abstract: This study investigates the growth mechanisms of carbon nanowalls (CNWs), which are two-dimensional carbon structures that consist of...

Authors: Mutsunori Uenuma, Kentaro Kawano, Bin Zheng, Masahiro Horita, Shigeo Yoshii, Ichiro Yamashita, Yukiharu Uraoka

Abstract: This study reports on the controlled single conductive path in ReRAM formed by embedding Pt nanoparticles (Pt NPs) in NiO film. Homogenous...

Authors: Masao Sakuraba, Katsutoshi Sugawara, Junichi Murota

Abstract: By low-temperature epitaxial growth of group IV semiconductors utilizing electron-cyclotron-resonance (ECR) plasma enhanced chemical vapor...

Authors: Shigeru Kimura, Yasuhiko Imai, Osamu Sakata, Akira Sakai

Abstract: We have developed new microdiffraction system at the SPring-8. This system uses a focused beam produced using a phase zone plate combined...

Authors: Yuusuke Hayashi, Ryu Hasunuma, Kikuo Yamabe

Abstract: Atomic force microscopy measurements are carried out on the surface and interface of SiO2 thermally grown on an atomically flat Si surface,...


Showing 11 to 20 of 39 Paper Titles