Effects of Fe-Doping on the Properties of CuAlO2


Article Preview

We added different amount of Fe (NO3)3 to the solution made of aluminum nitrate, copper nitrate and isopropanol to form gel. CuAl1-xFexO2 (x = 0, 0.01, 0.03, 0.05, 0.07, 0.09) powders and films were prepared in our experiments. The films were prepared on the quartz substrates. The powders and films were annealing at 1050 °C for 5 hours in the air. The powders were detected by X-ray diffraction to represent the structure of CuAl1-xFexO2. The square resistance of the films was determined by RTS-8 four-probe. The lowest square resistance is of CuAl0.95Fe0.05O2 film 3.3 KΩ/□ .Ultraviolet spectrophotometer (UV-3600, 230VCE) was used to measure the transmittance of the films. Fe-doping has a positive impact on the conductivity but negative impact on the transmittance.



Key Engineering Materials (Volumes 531-532)

Edited by:

Chunliang Zhang and Liangchi Zhang




C. Chen et al., "Effects of Fe-Doping on the Properties of CuAlO2", Key Engineering Materials, Vols. 531-532, pp. 212-215, 2013

Online since:

December 2012




[1] H. Kawazoe, M. Yasukawa, H. Hyodo, M. Kurita, H. Yanagi and H. Hosono: Nature Vol. 389 (1997), p.939.

DOI: https://doi.org/10.1038/40087

[2] R. Nagarajan, A.D. Draeseke, A.W. Sleight and J. Tate: J. Appl. Phys. , Vol. 89 (2001) No. 8, p.22.

[3] J. Tate, M.K. Jayaraj, A.D. Draeseke, T. Ulbrich, A.W. Sleight, K. A. Vanaja, R. Nagarajan J.F. Wager and R.L. Hoffman: Thin Solid Films, Vol. 4 (2002) No. 11, p.119.

DOI: https://doi.org/10.1016/s0040-6090(02)00199-2

[4] Tonooka K, Shimokawa K and Nishimura O: Thin Solid Films, Vol. 4 (2002) No. 11, p.129.

[5] K. Koumoto, H. Koduka and W.S. Seo: J. Mater. Chem. Vol. 11 (2001), p.251.

[6] W. Lan, W.L. Cao, M. Zhang, X.Q. Liu, Y.Y. Wang, E. Q. Xie, and H. Yan: J Mater Sci, vol. 44 (2009) , p.1594.

[7] Robert Laskowski, NielsEgede Christensen, Peter Blaha and Balan Palanivel: Physical Review , vol. 79 (2009), p.165.

[8] H. Yan: Preparetion and Properties of P-type Transparent Oxides Semiconductor with Delafossite structure (MS., Beijing University of Technology, China 2009), p.37. (In Chinese).

[9] W. Lan: Preparation and properties of p-type transparent conducting oxide CuAlO2 thin films(Ph.D., Lanzhou University, China 2007), p.94. (In Chinese).

[10] O. Khaselev: J.A. Turner, Science 280 (1998) , p.425.

[11] H.M. Luo, J. Menka, T.M. McCleskey, E. Bauer, A.K. Burrell and Q. x. Jia: Adv. Mater, Vol. 19 (2007) 3604–3607.

[12] A.N. Banerjee, S. Kundoo and K.K. Chattopadhyay, Thin Solid Films Vol. 440 (2003) 5–10.