TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions

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Periodical:

Materials Science Forum (Volumes 155-156)

Edited by:

Y. Limoge and J.L. Bocquet

Pages:

111-120

DOI:

10.4028/www.scientific.net/MSF.155-156.111

Citation:

R. Sinclair et al., "TEM and In Situ HREM for Studying Metal-Semiconductor Interfacial Reactions ", Materials Science Forum, Vols. 155-156, pp. 111-120, 1994

Online since:

May 1994

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$35.00

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