Defect Profiling with Pulsed e+-Beams

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Periodical:

Materials Science Forum (Volumes 175-178)

Edited by:

Yuan-Jin He, Bi-Song Cao and Y.C. Jean

Pages:

107-114

DOI:

10.4028/www.scientific.net/MSF.175-178.107

Citation:

G. Kögel "Defect Profiling with Pulsed e+-Beams", Materials Science Forum, Vols. 175-178, pp. 107-114, 1995

Online since:

November 1994

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$35.00

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