Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 189-190)

Main Theme:

Edited by:

B.C. Muddle

Pages:

115-120

DOI:

10.4028/www.scientific.net/MSF.189-190.115

Citation:

P. J. Warren and C.R.M. Grovenor, "Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys", Materials Science Forum, Vols. 189-190, pp. 115-120, 1995

Online since:

July 1995

Export:

Price:

$35.00

In order to see related information, you need to Login.