Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys

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Periodical:

Materials Science Forum (Volumes 189-190)

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Edited by:

B.C. Muddle

Pages:

115-120

Citation:

P. J. Warren and C.R.M. Grovenor, "Comparison of STEM and Atom Probe Methods for Chemical Analysis of Grain Boundaries in Commercial Al Alloys", Materials Science Forum, Vols. 189-190, pp. 115-120, 1995

Online since:

July 1995

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$38.00

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