Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

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Periodical:

Materials Science Forum (Volumes 204-206)

Edited by:

H. Yoshinaga, T. Watanabe and N. Takahashi

Pages:

729-734

DOI:

10.4028/www.scientific.net/MSF.204-206.729

Citation:

F. Czerwinski and J. A. Szpunar, "Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films", Materials Science Forum, Vols. 204-206, pp. 729-734, 1996

Online since:

March 1996

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$35.00

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