X-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-Iron

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Periodical:

Materials Science Forum (Volumes 204-206)

Edited by:

H. Yoshinaga, T. Watanabe and N. Takahashi

Pages:

743-748

DOI:

10.4028/www.scientific.net/MSF.204-206.743

Citation:

S. Fortunati and W. Graupner, "X-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-Iron", Materials Science Forum, Vols. 204-206, pp. 743-748, 1996

Online since:

March 1996

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