In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors

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Periodical:

Materials Science Forum (Volumes 204-206)

Edited by:

H. Yoshinaga, T. Watanabe and N. Takahashi

Pages:

749-754

Citation:

T. J. Konno and R. Sinclair, "In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors", Materials Science Forum, Vols. 204-206, pp. 749-754, 1996

Online since:

March 1996

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